The Definite Time Censorship Test with Stochastic Lose and Stochastic Add
Received:July 05, 1993  Revised:December 05, 1994
Key Words: stochastic lose   stochastic add   definite time censorship.  
Fund Project:
Author NameAffiliation
Zhang Liancheng Shengyang Institute of Technology
Shengyang 110015 
Qi Yanshen Shengyang Institute of Technology
Shengyang 110015 
Fu Denzhi Shengyang Institute of Technology
Shengyang 110015 
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Abstract:
      A method is proposed to estimate reliability parameters of products whose life satisfy exponential distribution model, under the definite time censorship longevity test with stochastic lose and stochastic add.
Citation:
DOI:10.3770/j.issn:1000-341X.1996.01.023
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